Mapping measurement

MC2 Technologies provides a unique set of automated on-wafer testing solutions for circuit characterization and sorting according to your product specifications.

A test station is used to obtain full circuits characterization from 0.5 to 220GHz.

We can perform several on-wafer test measurements (S parameters, Noise, Sensitivity, Power 1 & 2 Tones under DC or pulsed condition).

Individual die numbering allows identification of chips for sorting.