Mapping measurement

MC2 Technologies provides a unique set of automated on-wafer testing solutions for circuit characterization and sorting according to your product specifications.

A test station is used to obtain full circuits characterization from 0.5 to 220GHz.

We can perform several on-wafer test measurements (S parameters, Noise, Sensitivity, Power 1 & 2 Tones under DC or pulsed condition).

Individual die numbering allows identification of chips for sorting.

 

During the confinement period, MC2 Technologies' activity has adapted. Our collaborators remain at your disposal to answer your questions and requests via e-mail. COVID-19 INFO