› Material Characterization

• Square resistance, contact resistance, mobility, differential mobility,…
- Van der Paw technique, hall effect measurement, magneto resistance

• Extraction of complex permittivity, permeability, and conductivity for high and low loss materials
- Microwave techniques up to 220 GHz Free space, waveguide, propagation lines

• Study of deep centers, trap effects, interface charge, carrier density…
- C(V) measurements versus frequency 1kHZ - 1 GHz

• Determination of energy trap levels
- Photo ionization

• Focus Ion Beam

• Scanning Electron Microscope



Electroluminescence at 1.2 eV of GaAs PHEMT device (impact ionization)




Scanning Electron Microscope of a FP PHEMT device



tg δ of polycrystalline SiC versus frequency

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