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MC2-Technologies has developed a full automated pulsed IV/RF measurement setup.

Nowadays Pulsed IV measurement is the preferred method for capturing current-voltage characteristics of active devices like field effect and bipolar transistors for non linear modeling and/or physical analysis. The pulsed IV characteristics allow thermal and trap effects studying making this method suitable for power microwave transistors or amplifiers based on new semiconductor technologies (wide bandgap). This measurement setup has been developed by experts in modeling and microwave characterization. Thanks to the approach developed by MC2-Technologies experts, this setup allows to carry out an accurate modeling of non linear devices reducing development time and marketing.

MC2-Technologies has developed its new generation pulsed IV/RF measurement system, called APMS2010RA, to reach requirement for the most challenging problems usually faced with new generation of microwave devices.

This new measurement system is based on two standalone pulser heads embedding its own AD converters and pulse generators and placed as close as possible to the device under test. This criterion is the key point to reach fast rise and fall time pulse generation and to reduce the overshoots amplitude of the current impulse. One head type is dedicated for generating and measuring ±12V range. This head also measures the current with high accuracy. On the other hand the second heads type has been designed for ±200V range pulse generation and measurement. Despite the high current and voltage measurable value, this head enables high accuracy.

Pulsed IV Measurement System

The APMS2010RA is supplied with two pulser heads, one dedicated for high voltage and high current suitable for the drain/collector (APMS-HPM) and the second one designed to reach high accuracy in lower voltage and current suitable for gate/base (APMS-LPM). Two external power supplies are needed. Therefore if you already have GIPB compatible ones you can use it which allows money savings. Otherwise MC2-Technologies can provide these power supplies as optional modules. Furthermore bias Tees are the key point for accurate pulsed measurement. MC2-technologies has developed its own bias Tees for this measurement setup. These ones are optionally supplied. The measurement setup is also provided with user friendly software allowing pulse configuration, hardware management, batch measurement setup and so on. This software is installed on a laptop supplied with the solution. The software has been implemented by MC2-Technologies experts to provide a wide range of pulsed IV characterization and to perfectly answer the needs of non linear modeling or physical analysis. The user can observe all the voltage and current pulse shapes versus time without additional scope. The minimum time step available is 10ns, offering the right time resolution. The user can easily define the measurement window position for each voltage and current pulse. The software offers the opportunity to carry out a maximum of 32000 averages on each signal (voltages and currents) to increase the accuracy. Thanks to the pulser’s architecture, the measurement time is very fast even if the average number is high. The user can define various pulse’s configurations (duty cycles, pulse widths, measurement window positions, voltage ranges, power and current compliances, quiescent biasing points…) to characterize devices. All the configurations can be saved in a file in order to be reused later or imported into other software. The user can define a complete batch of measurements with different configurations. The system is fully autonomous, no external contribution is needed. The setup does not require standards for calibration and takes into account the voltage drops between the measurement reference planes and the DUT. The user can choose two different modes of measurement approach. If only IV pulse measurements are requested, the “no convergence” mode can be used. In this frame, the drain/collector step voltage won’t be constant and the measurement time will be very fast. On the other hand, if the user needs S parameters measurements with pulsed condition, one can choose the “convergence” mode to obtain a constant step of the drain/collector voltage.



Voltage and Current Measurements


Optional RF Sij Measurement Subsystem
  • Agilent PNA-X 2 or 4 ports Vector Network Analyzer allowing Sij measurements
  • PNA-X setup and calibration is performed by the user friendly software developed by MC2-Technologies. No specific knowledge is required.
  • Measurement timing and triggering of the PNA-X is handled by the supplied software
  • Pulse IV measurements are stored in any usual format MDF, CITI or CSV and S parameters are saved in MDF, tabular files or S2P.
  • Synchronization between the pulsed DC and pulsed RF is carried out by hardware and software supplied within our solution.

General Specifications

External DC power supplies:

Typical power supply 200V, 500mA with 10% duty cycle. The measurement setup is able to carry out pulsed measurements up to 4A. The power supply needed depends on the duty cycle used during measurements. For more information please contact MC2-Technologies.


Available Options

Download
Download this file (Data-sheet-V11.pdf)Data-sheet pulsed IV 724 Kb