Automated on-wafer testing solutions : Mapping measurement

MC2-Technologies provides a unique set of automated on-wafer testing solutions for circuit characterization and sorting according to your product specifications.
A test station enable full circuits characterization from 0.5 to 220GHz.
Measurement on-wafer tests are available (S parameters, Noise, Sensitivity, Power 1 & 2 Tones under DC or pulsed condition).
Individual die numbering allows identification of chips for sorting.